会議情報
ISOCC' 2018: International SoC Design Conference
http://www.isocc2018.org提出日: |
2018-07-13 |
通知日: |
2018-09-10 |
会議日: |
2018-11-12 |
場所: |
Daegu, Korea |
年: |
15 |
閲覧: 13084 追跡: 1 出席: 0
論文募集
We welcome all the researchers and colleagues from industries, academia, and research institutes to ISOCC 2018 to make this conference a valuable, enthusiastic, insightful, and enjoyable academic event in Korea. ISOCC 2018 is technically co-sponsored by IEEE CAS Society. All accepted papers will be published in the conference proceedings and will be submitted for inclusion in IEEE Xplore. We also welcome proposals for tutorials and special sessions.
Topics include, but are not limited to:
- Analog Circuits
Analog Circuits
Amplifiers and Filters
Power management circuits
- Data Converters
Analog-to-digital converter
Digital-to-analog converters
Analog circuits for data converters
- RF/Microwave/Wireless
RF circuits and transceivers
Microwave and Millimeter-wave circuits
Wireless communication circuits
- Wireline
High-speed interface
Wireline link
- Digital Architecture and Systems
Multimedia Systems & Image Processing Applications
Digital Signal Processing & Communication Systems
Embedded Software and Systems
- Digital Circuits and Memories
Digital Integrated Circuits
Hardware Security
Nanoelectronics and Gigascale Circuits and Systems
Memory Circuits & Systems
- SoC Design Methodology
Software & Algorithm
Artificial Intelligence and Deep Learning
HW-SW Co-design
Embedded SoC
SoC Testing
Design Verification
FPGA design
Signal Integrity / Interconnect Modeling and Simulation
- Circuits and Systems for Emerging Technologies
Neuromorphic Computing
Sensory Circuits and Systems
Biomedical Circuits and Systems
Automotive Circuits and Systems
IoT/IoE Circuits and Systems
3-D ICs and SoC Packages
- Special Session
最終更新 Dou Sun 2018-06-23
関連会議
| CCF | CORE | QUALIS | 省略名 | 完全な名前 | 提出日 | 通知日 | 会議日 |
|---|---|---|---|---|---|---|---|
| c | a2 | VTS | VLSI Test Symposium | 2025-11-03 | 2026-01-31 | 2026-04-27 | |
| c | 3DV | International Conference on 3D Vision | 2025-08-18 | 2025-11-05 | 2026-03-20 | ||
| c | a1 | ISLPED | International Symposium on Low Power Electronics and Design | 2025-03-10 | 2025-05-19 | 2025-08-06 | |
| c | b | b2 | IDC | International Conference on Interaction Design & Children | 2024-01-17 | 2024-03-18 | 2024-06-17 |
| a | a | a1 | DAC | Design Automation Conference | 2025-11-11 | 2026-03-09 | 2026-07-26 |
| b1 | ISQED | International Symposium on Quality Electronic Design | 2025-11-17 | 2026-01-22 | 2026-04-08 | ||
| a | a | a2 | ISSTA | International Symposium on Software Testing and Analysis | 2026-01-29 | 2026-06-25 | 2026-10-03 |
| b | a | a1 | ICCAD | International Conference on Computer-Aided Design | 2024-04-28 | 2024-06-30 | 2024-10-29 |
| c | a2 | ISPD | International Symposium on Physical Design | 2024-09-22 | 2024-11-06 | 2025-03-16 | |
| b | a2 | ICCD | International Conference on Computer Design | 2025-05-11 | 2025-08-01 | 2025-11-10 |
| 省略名 | 完全な名前 | 会議日 |
|---|---|---|
| VTS | VLSI Test Symposium | 2026-04-27 |
| 3DV | International Conference on 3D Vision | 2026-03-20 |
| ISLPED | International Symposium on Low Power Electronics and Design | 2025-08-06 |
| IDC | International Conference on Interaction Design & Children | 2024-06-17 |
| DAC | Design Automation Conference | 2026-07-26 |
| ISQED | International Symposium on Quality Electronic Design | 2026-04-08 |
| ISSTA | International Symposium on Software Testing and Analysis | 2026-10-03 |
| ICCAD | International Conference on Computer-Aided Design | 2024-10-29 |
| ISPD | International Symposium on Physical Design | 2025-03-16 |
| ICCD | International Conference on Computer Design | 2025-11-10 |
関連仕訳帳
| CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
|---|---|---|---|---|
| VLSI Design | Hindawi | 1065-514X | ||
| IEEE Design & Test | 1.900 | IEEE | 2168-2356 | |
| Materials & Design | 7.9 | Elsevier | 0264-1275 | |
| Journal of Control and Decision | 1.500 | Taylor & Francis | 2330-7706 | |
| b | Computer-Aided Design | 3.000 | Elsevier | 0010-4485 |
| Design Studies | 3.200 | Elsevier | 0142-694X | |
| Journal of Forecasting | 3.400 | Wiley-Blackwell | 0277-6693 | |
| IET Journal on Singal Processing | IET | 1751-9675 | ||
| Journal of Electronic Testing | 1.100 | Springer | 0923-8174 | |
| Swarm Intelligence | 2.100 | Springer | 1935-3812 |
| 完全な名前 | インパクト ・ ファクター | 出版社 |
|---|---|---|
| VLSI Design | Hindawi | |
| IEEE Design & Test | 1.900 | IEEE |
| Materials & Design | 7.9 | Elsevier |
| Journal of Control and Decision | 1.500 | Taylor & Francis |
| Computer-Aided Design | 3.000 | Elsevier |
| Design Studies | 3.200 | Elsevier |
| Journal of Forecasting | 3.400 | Wiley-Blackwell |
| IET Journal on Singal Processing | IET | |
| Journal of Electronic Testing | 1.100 | Springer |
| Swarm Intelligence | 2.100 | Springer |