会议信息
RQD 2020: ISSAT International Conference on Reliability and Quality in Design
https://www.issatconferences.org/rqd2020.html截稿日期: |
2020-04-15 Extended |
通知日期: |
2020-04-30 |
会议日期: |
2020-08-06 |
会议地点: |
Miami, Florida, USA |
届数: |
26 |
浏览: 11198 关注: 0 参加: 0
征稿
About the Conference
RQD 2020 is a major international conference event in the fields of reliability, risk assessment, quality in designs and statistics. For a quarter of a century, ISSAT RQD conference has brought together internationally renowned scholars, professors and researchers as well as scientists, engineers, practitioners, professionals and students worldwide to share, discuss and advance their research findings. The presented papers as well as keynote addresses were of high quality. ISSAT RQD conference has been greatly beneficial to its participants for their research and a starting place for many new collaborative works.
Topics of Interest
Reliability
Reliability Modeling and Testing
Software Reliability and Testing
Human Factors and Reliability
Statistical Approaches in Reliability
Network Reliability
Risk Assessment Modeling
Fault Tolerance
Modeling Analysis and Simulation
Quality Assurance and Cost Issues
Optimization
Survival Data Analysis
Quality Engineering
Quality Planning and Measurements
Maintainability and Availability
Methodologies for Quality Control
Software and Algorithms
Total Quality Management Techniques
Design Issues in Manufacturing
Engineering Design Optimization
Experimental Design for Quality Control
Performance Analysis
Process Control and Management
Parallel and Distributed Computing
Concurrent Engineering and Design
Big Data
Cloud Computing
Data Collection and Analysis
Data Computing
Data Mining and Analytics
Life Testing
Robust Design
Security Analytics
Safety-Critical and High Assurance Systems
Service Sciences
最后更新 Dou Sun 在 2020-04-03
相关会议
| 简称 | 全称 | 会议日期 |
|---|---|---|
| SBCCI | International Symposium on Integrated Circuits and Systems Design | 2026-08-24 |
| IWQoS | IEEE/ACM International Symposium on Quality of Service | 2025-07-02 |
| ISPD | International Symposium on Physical Design | 2025-03-16 |
| DSD | Euromicro Conference on Digital System Design | 2025-09-10 |
| ACSD | International Conference on Application of Concurrency to System Design | 2019-06-23 |
| ISQED | International Symposium on Quality Electronic Design | 2026-04-08 |
| QRS | International Conference on Software Quality, Reliability and Security | 2024-07-01 |
| SafeComp | International Conference on Computer Safety, Reliability and Security | 2024-09-17 |
| ARES | International Conference on Availability, Reliability and Security | 2020-08-24 |
| ISSRE | International Symposium on Software Reliability Engineering | 2024-10-28 |
相关期刊
| CCF | 全称 | 影响因子 | 出版商 | ISSN |
|---|---|---|---|---|
| International Journal of Reliability, Quality and Safety Engineering | World Scientific | 0218-5393 | ||
| c | IEEE Transactions on Reliability | 5.000 | IEEE | 0018-9529 |
| Materials & Design | 7.9 | Elsevier | 0264-1275 | |
| International Journal of Performability Engineering | 1.100 | RAMS Consultants | 0973-1318 | |
| Finite Elements in Analysis and Design | 3.500 | Elsevier | 0168-874X | |
| c | Software Quality Journal | 1.700 | Springer | 0963-9314 |
| c | Intelligent Data Analysis | 0.900 | IOS Press | 1088-467X |
| ACM Transactions on Probabilistic Machine Learning | ACM | 0000-0000 | ||
| Digital Investigation | Elsevier | 1742-2876 | ||
| Microelectronics Reliability | 1.600 | Elsevier | 0026-2714 |
| 全称 | 影响因子 | 出版商 |
|---|---|---|
| International Journal of Reliability, Quality and Safety Engineering | World Scientific | |
| IEEE Transactions on Reliability | 5.000 | IEEE |
| Materials & Design | 7.9 | Elsevier |
| International Journal of Performability Engineering | 1.100 | RAMS Consultants |
| Finite Elements in Analysis and Design | 3.500 | Elsevier |
| Software Quality Journal | 1.700 | Springer |
| Intelligent Data Analysis | 0.900 | IOS Press |
| ACM Transactions on Probabilistic Machine Learning | ACM | |
| Digital Investigation | Elsevier | |
| Microelectronics Reliability | 1.600 | Elsevier |