Información de la conferencia
Tau 2025: ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems
https://tauworkshop.com/2025/Día de Entrega: |
2025-01-13 |
Fecha de Notificación: |
2025-02-24 |
Fecha de Conferencia: |
2025-05-01 |
Ubicación: |
Monterey, California, USA |
Vistas: 6316 Seguidores: 0 Asistentes: 0
Solicitud de Artículos
It has become clear that timing analysis is NO longer a solved problem. So, what are new challenges as the industry embraces 5/3/2nm and below, rides the wave of ultra-low-power mobile, wearable devices and jumps on the IoT bandwagon? Are there new issues with older nodes, 14/28nm and up, in new design use cases? How do we model timing/power interactions? How do reliability requirements coming from ADAS/IoT and related impact timing? How to we apply AI/ML/Data Science techniques to the timing domain? How do we meet the insatiable demands for accuracy, performance and functionality? What new fundamental challenges are coming from process physics, 3D, variability, voltage sensitivity, analog effects, Quantum circuit modeling, Ising Models, Mixed signal modeling and validation?
The TAU series of workshops provide an informal forum for practitioners and researchers working on these and other temporal aspects of analog and digital systems to disseminate early work and engage in a free discussion of ideas. On the thirty-first anniversary of the Tau series, the Tau 2025 workshop invites submissions and proposals from the traditional as well as emerging areas related to the timing properties of digital electronic systems, including but not limited to the topics listed below.
Timing (including incremental timing)
System-level timing
Circuit/gate-level timing
Transistor-level timing
Timing of mixed signal circuits
New types of latches, dual-edge devices, etc.
Variability
Timing analysis under variation and uncertainty
Ultra-low voltage induced variation effects
Statistical timing analysis and optimization
Sensitivity/criticality analysis
Yield analysis and optimization
Characterization
Efficient cell (library) characterization
Variation effects and corner reductions
Latch characterization
Simulation and characterization of SRAM circuits
Emerging technologies
Full custom design analysis
Special circuit families
Timing issues for 3D ICs and TSVs
New modeling techniques and machine learning
Timing implications of emerging technologies
Modeling and simulation
Transistor level modeling
Analog circuit modeling
Circuit level simulation
Qubit logic modeling
Delay models and metrics
Reliability modeling and simulation
Power, trade-offs and optimization
Timing issues in low-power design
Power-delay tradeoffs
Identifying timing criticality in presence of voltage drop/supply noise/variability
Optimizing design in presence of non-constant supply (drop/noise/variability)
Clocking
Complex clock trees and networks
Clocking, synchronization, and skew
Clock domains, static/dynamic logic
Novel clocking schemes
Others
Integrated functional-temporal analysis
Formal theories and methods
Asynchronous systems
Smart sensor placement
FPGA Design and Analysis
Última Actualización Por Dou Sun en 2024-11-24
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Revistas Relacionadas
| CCF | Nombre Completo | Factor de Impacto | Editor | ISSN |
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| c | IEEE Transactions on Computational Social Systems | 4.500 | IEEE | 2373-7476 |
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| Telecommunication Systems | 1.700 | Springer | 1018-4864 | |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell | 0960-0833 | |
| b | Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd | 1099-1689 |
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| c | ACM Journal on Emerging Technologies in Computing Systems | 2.100 | ACM | 1550-4832 |
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| Nombre Completo | Factor de Impacto | Editor |
|---|---|---|
| IEEE Transactions on Computational Social Systems | 4.500 | IEEE |
| International Journal of E-Learning and Educational Technologies in the Digital Media | SDIWC | |
| Telecommunication Systems | 1.700 | Springer |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell |
| Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd |
| International Journal of Communication Systems | 1.700 | Wiley-Blackwell |
| ACM Journal on Emerging Technologies in Computing Systems | 2.100 | ACM |
| Proceedings of the ACM on the Measurement and Analysis of Computing Systems | 2.100 | ACM |
| International Journal of Instrumentation and Control Systems | AIRCC | |
| Modeling, Identification and Control | The Research Council of Norway |