We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

■ Single-Event Charge Collection Phenomena and Mechanisms
■ Ionizing Radiation Effects
■ Displacement Damage
■ Radiation Transport, Energy Deposition, and Dosimetry
■ Materials and Device Effects
■ Processing Related Radiation Effects

Hardness Assurance Covering Piece Parts, Systems, and Testing Approaches

■ New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
■ Unique Radiation Exposure Facilities, Test Facility Developments, Novel Instrumentation Methods
■ Dosimetry

Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems

■ Single Event Effects, Total Dose, and Displacement Damage
■ MOS, Bipolar, and Advanced Technologies
■ Systems on a Chip, GPUs, FPGAs, Microprocessors, and Neuromorphic Devices
■ Isolation Technologies, such as SOI and SOS
■ Methods for Hardened Design and Manufacturing
■ Modeling and Hardening of Devices and Circuits
■ Cryogenic or High Temperature Effects
■ Novel Device Structures, such as MEMS and Nanotechnologies
■ Emerging Modeling and Experimental Techniques for Hardening Systems

Space, Atmospheric, and Terrestrial Radiation Effects

■ Characterization and Modeling of Radiation Environments
■ Space Weather Events and Effects
■ Spacecraft Surface and Internal Charging
■ Predicting and Verifying Soft Error Rates (SER)

New Developments of Interest to the Radiation Effects Community

Data Workshop

The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic devices in a radiation environment, and for designers of radiation-hardened systems. Papers describing new simulation or radiation facilities are also welcomed.