会議情報
ETS 2026: European Test Symposium
https://ets2026.uniwa.gr/提出日: |
2025-12-01 |
通知日: |
|
会議日: |
2026-05-25 |
場所: |
Chania, Greece |
年: |
31 |
CCF: c QUALIS: b2 閲覧: 38521 追跡: 37 出席: 3
論文募集
Conference Topics Dependable AI and AI for Testing Functional Safety, Fault Tolerance and Reliability Methods for Emerging Technologies and Architectures Security and Trust Test and Reliability for Analog, Mixed-Signal, and RF DFT, Test Access Standards and Test application Validation, Verification, and Debug Test Generation, Fault Modeling & Simulation, and Diagnosis
最終更新 Dou Sun 2025-07-13
関連会議
| CCF | CORE | QUALIS | 省略名 | 完全な名前 | 提出日 | 通知日 | 会議日 |
|---|---|---|---|---|---|---|---|
| b | a | a1 | ECCV | European Conference on Computer Vision | 2026-03-06 | 2026-05-09 | 2026-09-08 |
| c | b2 | ETS | European Test Symposium | 2025-12-01 | 2026-05-25 | ||
| c | EuroS&P | IEEE European Symposium on Security and Privacy | 2025-11-13 | 2026-03-05 | 2026-07-06 | ||
| b1 | EuroGP | European Conference on Genetic Programming | 2025-11-01 | 2026-01-10 | 2026-04-08 | ||
| a | a | a2 | EuroSys | European Conference on Computer Systems | 2025-09-18 | 2026-01-30 | 2026-04-13 |
| c | ATS | Asian Test Symposium | 2025-08-05 | 2025-09-24 | 2025-12-16 | ||
| b | a | a2 | ESA | European Symposium on Algorithms | 2025-04-23 | 2025-06-23 | 2025-09-15 |
| a | a2 | ESOP | European Symposium on Programming | 2024-10-10 | 2024-12-19 | 2025-05-03 | |
| b | b1 | EUSIPCO | European Signal Processing Conference | 2017-03-05 | 2017-05-25 | 2017-08-28 | |
| c | b1 | ECOWS | European Conference on Web Services | 2011-05-25 | 2011-09-14 |
関連仕訳帳
| CCF | 完全な名前 | インパクト ・ ファクター | 出版社 | ISSN |
|---|---|---|---|---|
| b | European Journal of Information Systems | 8.6 | Taylor & Francis | 0960-085X |
| c | International Journal of Neural Systems | 6.4 | World Scientific | 0129-0657 |
| European Journal of Operational Research | 6.0 | Elsevier | 0377-2217 | |
| Computers & Operations Research | 4.3 | Elsevier | 0305-0548 | |
| Future Internet | 3.6 | MDPI | 1999-5903 | |
| Brain Sciences | 2.8 | MDPI | 2076-3425 | |
| c | Expert Systems | 2.3 | John Wiley & Sons | 1468-0394 |
| IEEE Design & Test | 1.9 | IEEE | 2168-2356 | |
| Journal of Electronic Testing | 1.3 | Springer | 0923-8174 | |
| Journal of Function Spaces | 1.3 | Hindawi | 2314-8896 |