Conference Information
ETS 2026: European Test Symposium
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Submission Date: |
2025-12-01 |
Notification Date: |
|
Conference Date: |
2026-05-25 |
Location: |
Chania, Greece |
Years: |
31 |
CCF: c QUALIS: b2 Viewed: 39540 Tracked: 37 Attend: 3
Call For Papers
Conference Topics
Dependable AI and AI for Testing
Functional Safety, Fault Tolerance and Reliability
Methods for Emerging Technologies and Architectures
Security and Trust
Test and Reliability for Analog, Mixed-Signal, and RF
DFT, Test Access Standards and Test application
Validation, Verification, and Debug
Test Generation, Fault Modeling & Simulation, and Diagnosis
Dependable AI and AI for Testing
Functional Safety, Fault Tolerance and Reliability
Methods for Emerging Technologies and Architectures
Security and Trust
Test and Reliability for Analog, Mixed-Signal, and RF
DFT, Test Access Standards and Test application
Validation, Verification, and Debug
Test Generation, Fault Modeling & Simulation, and Diagnosis
Last updated by Dou Sun in 2025-07-13
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Related Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| b | European Journal of Information Systems | 8.6 | Taylor & Francis | 0960-085X |
| c | International Journal of Neural Systems | 6.4 | World Scientific | 0129-0657 |
| European Journal of Operational Research | 6.0 | Elsevier | 0377-2217 | |
| Computers & Operations Research | 4.3 | Elsevier | 0305-0548 | |
| Future Internet | 3.6 | MDPI | 1999-5903 | |
| Brain Sciences | 2.8 | MDPI | 2076-3425 | |
| c | Expert Systems | 2.3 | John Wiley & Sons | 1468-0394 |
| IEEE Design & Test | 1.9 | IEEE | 2168-2356 | |
| Journal of Electronic Testing | 1.3 | Springer | 0923-8174 | |
| Journal of Function Spaces | 1.3 | Hindawi | 2314-8896 |