Conference Information
HLDVT 2016: International High-Level Design, Validation, and Test Workshop
http://www.hldvt.org/Submission Date: |
2016-07-24 Extended |
Notification Date: |
2016-08-15 |
Conference Date: |
2016-10-07 |
Location: |
Silicon Valley, California, USA |
Years: |
18 |
Viewed: 11222 Tracked: 1 Attend: 0
Call For Papers
The 18th HLDVT workshop aims to bring together a community of researchers in the areas of design, validation, and test of hardware, software, cyber-physical systems, biological systems, and biochips. The workshop addresses the integration of multiple functions on-chip/in-system at higher levels of design abstraction, and the techniques and methodologies for modeling, analyzing, and validating such systems. In particular, the workshop has become a unique forum for researchers and practitioners to discuss the practical issues associated with validation of extremely large designs. Topics of interest include, but are not limited to: - Simulation-Based Validation - Formal Verification, and Hybrid Methods - Design Abstraction, and Behavioral Modeling - Error Trace Interpretation, and Debugging - Functional Safety/Safety-critical System Verification - On-Chip, and Core-Based Testing - Test Generation for Defects, Design Errors, and Delay Faults - Hardware/Software, and Mixed-signal System Co-Validation - Emulation, and Prototyping - Post-silicon Validation, and Debug. Paper Submission: The Program Committee invites authors to submit papers not to exceed 8 pages (in the IEEE two-column conference format with 10-pt font size), describing original and unpublished work. Panels and special session proposals are also invited. All submissions must be made electronically in PDF format, using the paper submission web site: https://easychair.org/conferences/?conf=hldvt16. Paper Publication and Presenter Registration: The submission of a paper or panel proposal will be considered as evidence that upon acceptance, the author(s) will present their work. For the papers to appear in the program and proceedings, at least one full workshop registration by an author is required before the submission of the camera-ready version. IEEE reserves the right to exclude a paper from distribution (e.g., removal from IEEE Xplore) if the paper is not presented at the workshop.
Last updated by Dou Sun in 2016-07-22
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Related Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| International journal of VLSI Design & Communication Systems | AIRCC | 0976-1527 | ||
| c | Machine Vision and Applications | 2.400 | Springer | 0932-8092 |
| IEEE Design & Test | 1.900 | IEEE | 2168-2356 | |
| International Journal of High Performance Computing Applications | SAGE | 1094-3420 | ||
| Design Automation for Embedded Systems | 0.900 | Springer | 0929-5585 | |
| b | ACM Transactions on Design Automation of Electronic Systems | 2.200 | ACM | 1084-4309 |
| Universal Access in the Information Society | 2.100 | Springer | 1615-5289 | |
| Wireless Personal Communications | 1.900 | Springer | 0929-6212 | |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell | 0960-0833 | |
| b | Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd | 1099-1689 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| International journal of VLSI Design & Communication Systems | AIRCC | |
| Machine Vision and Applications | 2.400 | Springer |
| IEEE Design & Test | 1.900 | IEEE |
| International Journal of High Performance Computing Applications | SAGE | |
| Design Automation for Embedded Systems | 0.900 | Springer |
| ACM Transactions on Design Automation of Electronic Systems | 2.200 | ACM |
| Universal Access in the Information Society | 2.100 | Springer |
| Wireless Personal Communications | 1.900 | Springer |
| Software Testing Verification and Reliability | 1.500 | Wiley-Blackwell |
| Software Testing, Verification and Reliability | 1.500 | John Wiley & Sons, Ltd |