The program includes keynotes, scientific paper presentations, and special sessions.

You are invited to participate and submit your contributions to IOLTS’25. The areas of interest include (but are not limited to) the following topics:

    Dependable system design
    Dependable Computer Architectures
    Design-for-Reliability
    Design for Reliability approaches for Low-Power
    Cross-layer reliability approaches
    Fault-Tolerant and Fail-Safe systems
    Functional safety
    Self-Test and Self-Repair
    Self-Healing design
    Self-Regulating design
    Self-Adapting design
    Reliability issues of Low-Power Design
    Robustness evaluation
    Quality, yield, reliability, and lifespan issues in nanometer technologies
    Variability, Aging, EMI, and Radiation Effects in nanometer technologies
    On-line testing techniques for digital, analog, and mixed-signal circuits
    Self-checking circuits and coding theory
    On-line monitoring of current, temperature, process variations, and aging
    Power density and overheating issues in nanometer technologies
    Field Diagnosis, Maintainability, and Reconfiguration
    Design for Security
    Fault-based attacks and countermeasures
    Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
    CAD for robust circuits design